H 00081008
COMPUTER VISION BASED SYSTEM FOR APPLE SURFACE DEFECT DETECTION
L
CN/UNIV ZHEJIANG, CN/RESEARCH CENTRE FOR PRECISION AGRICULTURE BEIJING
COMPUTERS AND ELECTRONICS IN AGRICULTURE
2002
36
P. 215-223
anglais, illus., TABL_>6TABL, biblio.
B8 01
mesure non destructive, qualité du produit frais, instrumentation, défaut d'aspect
06/09/2005